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|MSE 113 - Materials Characterization|
Characterization of materials structure and properties. Interactions between electromagnetic radiation and matter, and between electron beams and matter. Principles of image formation; Fourier methods and convolution; image processing. X-ray diffraction, optical and electron imaging and diffraction; scanned probe methods. Thermal analysis. Mechanical property and failure characterization.
0.000 OR 4.000 Credit hours
Schedule Types: Lecture plus Sup. Activity, Exam, Laboratory Skills/Techniques, Lecture
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